光源類型

Light type

氙燈穩(wěn)態(tài)光源

Xenon Lamp

冷卻方式

Cooling

定制風(fēng)冷

Forced air cooling

光源壽命

Light source lifetime

＞1000h

＞1000h

光譜范圍

Spectrum wavelength

300-1200nm

300-1200nm

光源等級(jí)

Classfication of light source

光譜匹配度  0.875-1.125 A+

輻照度不均勻度  ≤1% A+

輻照度不穩(wěn)定度  ≤1% A+

Spectral match is 0.875-1.125, class   A+

Irradiance non-uniformity is ≤1%,  class   A+

Irradiance instability is ≤1%,  class   A+

輻照度范圍

Irradiance intensity

200W/㎡~1200W/㎡

200W/㎡~1200W/㎡

測(cè)試面積

Illumination area

? 1200*600mm

? 2600*1400mm? 可定制其他尺寸

? 1200*600mm

? 2600*1400mm? Other size can be customized

測(cè)試模式  

Test mode

穩(wěn)態(tài)測(cè)試模式可自由設(shè)定由1s到連續(xù)照光

Under steady-state mode, it can be set freely from 1s to continuous illumination. Besides

多通道設(shè)計(jì)

Multi-channel testing design

可實(shí)現(xiàn)36通道同時(shí)測(cè)試，通道數(shù)量可定制

36 channels can be tested simultaneously, and the number of channels can be customized

測(cè)試技術(shù)

Testing technology

標(biāo)配I-V、V-I掃描方式，具備MPPT（最大功率點(diǎn)追蹤）、I-t（定電壓）等多種測(cè)試技術(shù)，可通過軟件切換，同時(shí)集成逐點(diǎn)掃描方式（滿足最短≤0.2s步進(jìn)的掃描方式）

It equipped with I-V, V-I scanning, MPPT (maximum power point tracking), I-t (constant voltage) and other test technologies, all these technologies can be switched by software.  It also equipped point-by-point scanning ( meet the shortest scanning in step of ≤0.2s

測(cè)試電池

Measurable cell type

多晶、單晶、Topcon、BC、異質(zhì)結(jié)、CIGS、GaAs、CdTe、鈣鈦礦、鈣鈦礦疊層等

Poly-crystalline, Mono-crystalline, TopCon, HJT, BC,CIGS, GaAs, CdTe and Perovskite

可增配項(xiàng)

Optional service

? 集成溫控系統(tǒng)，實(shí)現(xiàn)溫度系數(shù)測(cè)試

? 集成EL測(cè)試系統(tǒng)，實(shí)現(xiàn)同工位IV/EL測(cè)試

? 集成IR紅外熱像儀，實(shí)現(xiàn)熱斑測(cè)試

? Temperature Chamber can be integrated

   to achieve measurement of temperature

   coefficient

? EL testing system can achieve IV and EL

   testing at a same production section

? Integrated with IR infrared thermal imager

   to realize heat spot testing